Concept information
Preferred term
atomic force microscopy
Definition(s)
- Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. (From Wikipedia)
Synonym(s)
- AFM
Belongs to group
In other languages
-
French
URI
http://data.loterre.fr/ark:/67375/37T-G15QRMKT-7
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