skip to main content
LOTERRE

LOTERRE

Search from vocabulary

Lengua del contenido

| français English
Ayuda para la búsqueda

Concept information

Término preferido

atomic force microscopy  

Definición

  • Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. (From Wikipedia)

etiqueta alternativa (skos)

  • AFM

En otras lenguas

URI

http://data.loterre.fr/ark:/67375/37T-G15QRMKT-7

Descargue este concepto:

RDF/XML TURTLE JSON-LD última modificación 2/11/22